Wafer Tester, Monitoring Defects and Contamination in the Bulk Region of Si Wafer

Price:
Negotiable
minimum:
Total supply:
Delivery term:
The date of payment from buyers deliver within days
seat:
Beijing
Validity to:
Long-term effective
Last update:
2017-11-21 18:03
Browse the number:
66

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Company Profile

GBSA(Gyeonggido Business & Science Accelerator) / WTC suwon

By certification [File Integrity]

Contact: gbsa(Ms.)

Telephone:

Area: Beijing

Address: Beijing

Website: http://gbsa.zhengdaprint.com/

Product details

Model Number: KP - A65 Key Specifications/Special Features: Special features:Monitoring defects and contamination in the bulk region of Si waferKey specifications:Impurities due to heavy metal contaminationCan detect Co, Ni, Ti, Mo, W, Pt, Au and PdCan detect but not identify them uniquelyCan detect and identify Cu and CrIron concentration determination both in CZ and FZ wafers

Requires surface passivation: thermal oxide, chemical passivation or corona charging

Can be combined with the SPV, VQ and JPV

Integrated FOUP and mini environment

Main Export Markets:

Asia